New Testing Scheme Could Work for Chips and Clinics
Diagnostic testing is a major industry. The global market for testing semiconductors for defects is expected to reach $39 billion by 2025, while medical laboratory tests represent an even larger market, estimated at $125 billion.
Steve Brooks from the University of Texas at Austin reports, with edits by Gaby Clark and review by Robert Egan. The article was reviewed according to Science X’s editorial standards to ensure content credibility.
Common Challenges in Diagnostic Testing
Both semiconductor and medical testing share similarities, says Rohan Ghuge, assistant professor of decision science at Texas McCombs School of Business. They involve complex systems made up of numerous components, whether they're computer chips or the human body.
Innovative Approach to Testing Complex Systems
Research from Texas McCombs proposes a new testing method that could save time by removing some costly and unnecessary steps.
The study titled “Nonadaptive Stochastic Score Classification and Explainable Half-Space Evaluation” is published in Operations Research.
Limitations of Current Testing Methods
Currently, a common approach tests components in sequences rather than all at once, as testing every element is impractical for complex systems. For example, a clinician may check certain functions first, ruling out some problems and then deciding on the next tests.
“First, you might check the vital signs.”
However, this sequential testing can be time-consuming and inefficient.
Author’s Summary
The new testing method promises to streamline diagnostic processes for complex systems, reducing time and costs by cutting unnecessary steps.